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File | Description | Size | Format |
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ATTACHMENT01 | bertrand_1999_carbon_black_characterization | 2 KB | GIF Image |
MARCXML | Carbon black surface characterization by TOF-SIMS and XPS | 2 KB | XML Document |
Bertrand, P., Weng, T.. Carbon black surface characterization by TOF-SIMS and XPS. 2019-03-06 |2019-03-06 |2001–1 |1999 | | | | | | |.